Three-dimensional discharge simulation of inductively coupled plasma (ICP) etching reactor

被引:0
作者
YiRan An
YiJia Lu
DongSan Li
YaoSong Chen
机构
[1] Peking University,Department of Mechanics
[2] North Microelectronic Co. Ltd.,undefined
来源
Science in China Series E: Technological Sciences | 2008年 / 51卷
关键词
inductively coupled plasma; electron density; electron temperature; power deposition;
D O I
暂无
中图分类号
学科分类号
摘要
More and more importance has been attached to inductively coupled plasma (ICP) in semiconductor manufacture. For a deep understanding of the plasma discharge process in the etching reactor, this study made a three-dimensional simulation on the Ar plasma discharge process with the commercial software CFD-ACE, which is according to the real experiment conditions and data supplied by North Microelectronic Corporation. The error of the simulation results is in the range of ±20% with credibility. The numerical results show that the three-dimentional spatial distribution of electron density is reduced from the chamber center to the wall. The distribution of electron density, electron temperature and power deposition is related to the shape and placement of the coil.
引用
收藏
页码:674 / 682
页数:8
相关论文
共 35 条
  • [1] Ventzek P. L. G.(1994)Investigation of electron source and ion flux uniformity in high plasma density inductively coupled etching tools using two-dimensional modeling J Vac Sci Technol B 12 3118-3137
  • [2] Grapperhaus M.(1993)Novel radio-frequency induction plasma processing techniques J Vac Sci Technol A 11 2487-2491
  • [3] Kushner M. J.(1993)Electron energy distribution function measurements in a planar inductive oxygen radio frequency glow discharge Appl Phys Lett 62 2622-2624
  • [4] Keller J. H.(1994)Planar RF induction plasma coupling efficiency Plasma Sources Sci Technol 3 460-464
  • [5] Forster J. C.(1994)Electron-density and energy distributions in a planar inductively coupled discharge J Appl Phys 76 2041-2047
  • [6] Barnes M. S.(1993)Application of a high density inductively coupled plasma reactor to polysilicon etching J Vac Sci Technol A 11 1296-1300
  • [7] Barnes M. S.(1994)Two-dimensional self-consistent fluid simulation of radio frequency inductive sources J Vac Sci Technol A 12 1387-1396
  • [8] Forster J. C.(1995)Plasma uniformity in high-density inductively coupled plasma tools Plasma Source Sci Technol 4 36-46
  • [9] Keller J. H.(1996)Ion drag effects in inductively coupled plasmas for etching Appl Phys Lett 68 903-905
  • [10] Hopwood J.(1996)Two-dimensional fluid model of an inductively coupled plasma with comparison to experimental spatial profiles J Appl Phys 80 2614-2623