Strong correlation between capacitance and breakdown voltage of GaInN/GaN light-emitting diodes

被引:0
作者
Jaehee Cho
E. F. Schubert
Joong Kon Son
Dong Yeong Kim
Jong Kyu Kim
机构
[1] Chonbuk National University,School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center
[2] Rensselaer Polytechnic Institute,Future Chips Constellation, Department of Electrical, Computer, and Systems Engineering
[3] Samsung Electronics,LED Business
[4] Pohang University of Science and Technology,Department of Materials Science and Engineering
来源
Electronic Materials Letters | 2014年 / 10卷
关键词
light-emitting diode; breakdown voltage; capacitance; GaN;
D O I
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中图分类号
学科分类号
摘要
Investigating the relationship between the breakdown voltage and the capacitance of GaInN light-emitting diodes (LEDs), we find that a lower capacitance due to weaker internal electric field in depletion region or wider depletion width at the pn junction results in lower reverse leakage current and thus larger breakdown voltage. The measured breakdown voltage and capacitance of LEDs show a strong correlation, opening a nondestructive and non-intrusive way to estimate the breakdown voltage of an LED based on the capacitance-voltage measurement.
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页码:1155 / 1157
页数:2
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