Neutron Reflectometry Studies of ZnO Films

被引：0

作者：

Zhaketov V.D. ^{[1
]}

Chitanu E. ^{[2
]}

Nikitenko Y.V. ^{[1
]}

机构：

[1] Joint Institute for Nuclear Research, Dubna, Moscow oblast

[2] National Institute for Electrical Engineering ICPE-CA, Bucharest

来源：

Journal of Surface Investigation | 2018年 / 12卷 / 04期

关键词：

neutron reflectometry; quasiperiodic structures;

D O I：

10.1134/S1027451018040195

中图分类号：

学科分类号：

摘要：

Textured Al-doped ZnO films are studied using neutron reflectometry. The films are quasiperiodic structures with a period of several nanometers. The films are inhomogeneous in a surface layer with a thickness of 10–20 nm. © 2018, Pleiades Publishing, Ltd.

引用

页码：658 / 664

页数：6

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