Deep UV light emitting diodes grown by gas source molecular beam epitaxy

被引:0
作者
Sergey Nikishin
Boris Borisov
Vladimir Kuryatkov
Mark Holtz
Gregory A. Garrett
Wendy L. Sarney
Anand V. Sampath
Hongen Shen
Michael Wraback
Alexander Usikov
Vladimir Dmitriev
机构
[1] Texas Tech University,Nano Tech Center
[2] AMSRD-ARL-SE-EM,U.S. Army Research Laboratory
[3] TDI,undefined
[4] Inc.,undefined
来源
Journal of Materials Science: Materials in Electronics | 2008年 / 19卷
关键词
Reflection High Energy Electron Diffraction; Hydride Vapor Phase Epitaxy; Reflection High Energy Electron Diffraction Pattern; Ammonia Flux; Specific Contact Resistivity;
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摘要
We report the structural, electrical, and optical properties of deep UV light emitting diodes (LEDs) grown by gas source molecular beam epitaxy with ammonia on sapphire and AlN/sapphire template substrates. AlN/sapphire substrates were grown by stress controlled hydride vapor phase epitaxy (HVPE). LEDs based on n- and p-type AlN/AlxGa1−xN (0.05 ≤ x ≤ 0.08) superlattices are demonstrated operating to wavelengths as short as 250 nm. We report a significant enhancement in the cathodoluminescence intensities (by factor of ∼100) and photoluminescence lifetimes in the AlxGa1−xN/AlyGa1−yN superlattices consisting of well material grown in the three dimensional mode. We interpret these observations in terms of formation of quantum well/quantum dot active regions.
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页码:764 / 769
页数:5
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