Effect of surface roughness on quantum carrier transport in ultrathin films

被引：0

作者：

Ananiev S.D. ^{[1
]}

V'yurkov V.V. ^{[1
]}

Orlikovsky A.A. ^{[1
]}

机构：

[1] Institute of Physics and Technology, Russian Academy of Sciences, Moscow

来源：

Russian Microelectronics | 2004年 / 33卷 / 3期

关键词：

Experimental Data; Surface Roughness; Metal Film; Carrier Transport; Surface Irregularity;

D O I：

10.1023/B:RUMI.0000026173.74951.aa

中图分类号：

学科分类号：

摘要：

A theoretical study is reported of the carrier transport in an ultrathin metal film and a quantum-well layer subject to scattering by surface irregularities. A consistent quantum-mechanical approach to the problem is developed. Power-law approximations with different exponents are obtained to the conductivity-thickness relationship. The results are compared with previously published experimental data.

引用

页码：159 / 164

页数：5

共 50 条

[31] Surface roughness and chemical properties of porous inorganic films [J].

Eggen, Carrie L. ;

McAfee, Paul M. ;

Jin, Yi ;

Lin, Y. S. .

THIN SOLID FILMS, 2015, 591 :111-118

[32] Surface roughness modulated resistivity in copper thin films [J].

Song, HongKang ;

Xia, Ke ;

Xiao, Jiang .

SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2018, 61 (10)

[33] Effect of machining on surface roughness of wood [J].

Kilic, M ;

Hiziroglu, S ;

Burdurlu, E .

BUILDING AND ENVIRONMENT, 2006, 41 (08) :1074-1078

[34] Studies of the structure and surface roughness of AlN thin films [J].

Xu, XH ;

Wu, HS ;

Jin, ZH .

RARE METAL MATERIALS AND ENGINEERING, 2000, 29 (06) :394-397

[35] Surface roughness modulated resistivity in copper thin films [J].

HongKang Song ;

Ke Xia ;

Jiang Xiao .

Science China Physics, Mechanics & Astronomy, 2018, 61

[36] Effect of surface roughness on tyre characteristics [J].

Becker, Carl ;

Els, Schalk .

JOURNAL OF TERRAMECHANICS, 2022, 102 :27-48

[37] Spin splitting in longitudinal carrier transport in quantum structures [J].

Tager, AS .

TECHNICAL PHYSICS LETTERS, 1997, 23 (02) :163-165

[38] Effect of the surface roughness on the detecting capacitance [J].

Zhang, Haifeng ;

Liu, Xiaowei ;

Li, Hai ;

Chen, Nan ;

Fu, Yibo .

MICRO-NANO TECHNOLOGY XIV, PTS 1-4, 2013, 562-565 :1461-+

[39] Surface Roughness Effect on Micropillar Cavities [J].

Xu, Qiang ;

Xie, Xiumin ;

Shen, Bizhou ;

Chen, Jian ;

Dai, Qian ;

Song, Hai-Zhi ;

Zhou, Qiang .

2017 9TH INTERNATIONAL CONFERENCE ON ADVANCED INFOCOMM TECHNOLOGY (ICAIT 2017), 2017, :30-34

[40] Carrier transport in asymmetric multiple quantum well structures [J].

Shulika, Oleksiy ;

Petrov, Sergii ;

Semenets, Valerii ;

Sukhoivanov, Igor .

ICTON 2008: PROCEEDINGS OF 2008 10TH ANNIVERSARY INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS, VOL 2, 2008, :117-119

← 1 2 3 4 5 →