X-ray diffraction studies of the Tl(GaS2)1–x(InSe2)x solid solutions

被引：0
|
作者：
A. U. Sheleg
V. G. Hurtavy
V. A. Chumak
S. N. Mustafaeva
E. M. Kerimova
机构：
[1] National Academy of Sciences of Belarus,Scientific
[2] Azerbaijan National Academy of Sciences,Practical Materials Research Center
来源：
Crystallography Reports | 2016年 / 61卷
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The unit-cell parameters of crystals obtained in the Tl(GaS2)1–x(InSe2)x system are measured by X-ray diffraction. The relationship between these parameters and composition is determined. It is shown that, with growing x, the a, b, and c parameters increase and the β angle decreases. Two types of solid solutions are found in the Tl(GaS2)1–x(InSe2)x system: one is based on compound TlGaS2 with monoclinic structure and the other is based on TlInSe2 with tetragonal structure.
引用
收藏
页码：587 / 591
页数：4
相关论文
共 50 条
  • [1] X-ray Diffraction Studies of the Tl(GaS2)1-x (InSe2) x Solid Solutions
    Sheleg, A. U.
    Hurtavy, V. G.
    Chumak, V. A.
    Mustafaeva, S. N.
    Kerimova, E. M.
    CRYSTALLOGRAPHY REPORTS, 2016, 61 (04) : 587 - 591
  • [2] The electric conductivity and dielectric properties of Tl(GaS2)1 – x(InSe2)x solid solutions
    V. G. Hurtavy
    A. U. Sheleg
    S. N. Mustafaeva
    E. M. Kerimova
    S. G. Dzhafarova
    Physics of the Solid State, 2017, 59 : 1501 - 1505
  • [3] The electric conductivity and dielectric properties of Tl(GaS2)1-x (InSe2) x solid solutions
    Hurtavy, V. G.
    Sheleg, A. U.
    Mustafaeva, S. N.
    Kerimova, E. M.
    Dzhafarova, S. G.
    PHYSICS OF THE SOLID STATE, 2017, 59 (08) : 1501 - 1505
  • [4] Properties of Cu1-x K x InSe2 alloys
    Muzzillo, Christopher P.
    Mansfield, Lorelle M.
    Ramanathan, Kannan
    Anderson, Timothy J.
    JOURNAL OF MATERIALS SCIENCE, 2016, 51 (14) : 6812 - 6823
  • [5] X-ray diffraction study of the crystallographic characteristics of TlInS x Se2-x solid solutions
    Sheleg, A. U.
    Hurtavy, V. G.
    Shautsova, V. V.
    Aliev, V. A.
    CRYSTALLOGRAPHY REPORTS, 2014, 59 (02) : 186 - 189
  • [6] X-ray diffraction study of the crystallographic characteristics of TlInSxSe2 − x solid solutions
    A. U. Sheleg
    V. G. Hurtavy
    V. V. Shautsova
    V. A. Aliev
    Crystallography Reports, 2014, 59 : 186 - 189
  • [7] X-ray diffraction analysis of solid solutions
    Abbas, S
    Raho, A
    Kadi-Hanifi, M
    JOURNAL DE PHYSIQUE IV, 2000, 10 (P10): : 49 - 54
  • [8] Synthesis and X-ray diffraction of CdxHg1 − x Te solid solutions
    O. A. Fedyaeva
    Russian Journal of Inorganic Chemistry, 2012, 57 : 39 - 40
  • [9] X-ray diffraction and Raman spectroscopic studies on ThO2- UO2 solid solutions
    Nandi, Chiranjit
    Kesari, Swayam
    Phatak, Rohan
    Sanyal, Kaushik
    Rao, Rekha
    Prakash, Amrit
    JOURNAL OF NUCLEAR MATERIALS, 2024, 590
  • [10] X-ray diffraction (XRD) studies on (CuAlSe2)x (FeSe)1-x alloys
    Gallardo, PG
    Cárdenas, K
    Quintero, M
    Ruiz, J
    Delgado, G
    MATERIALS RESEARCH BULLETIN, 2001, 36 (5-6) : 861 - 866
12345