Molecular mapping of genes Yr64 and Yr65 for stripe rust resistance in hexaploid derivatives of durum wheat accessions PI 331260 and PI 480016

被引：0
作者：
P. Cheng
L. S. Xu
M. N. Wang
D. R. See
X. M. Chen
机构：
[1] Washington State University,Department of Plant Pathology
[2] US Department of Agriculture,Wheat Genetics, Quality, Physiology and Disease Research Unit, Agricultural Research Service
来源：
Theoretical and Applied Genetics | 2014年 / 127卷
关键词：
Simple Sequence Repeat Marker; Durum Wheat; Common Wheat; Stripe Rust; Bulk Segregant Analysis;
D O I：
暂无
中图分类号：
学科分类号：
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页码：2267 / 2277
页数：10
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