Vacancy-oxygen defects in silicon: the impact of isovalent doping

被引:0
作者
C. A. Londos
E. N. Sgourou
D. Hall
A. Chroneos
机构
[1] University of Athens,Solid State Section, Physics Department
[2] The Open University,Department of Physical Sciences
[3] The Open University,Engineering and Innovation
[4] Imperial College London,Department of Materials
来源
Journal of Materials Science: Materials in Electronics | 2014年 / 25卷
关键词
Covalent Radius; Vacancy Formation Energy; Neutral Charge State; Local Vibrational Mode; Oxygen Precipitation;
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摘要
Silicon is the mainstream material for many nanoelectronic and photovoltaic applications. The understanding of oxygen related defects at a fundamental level is essential to further improve devices, as vacancy-oxygen defects can have a negative impact on the properties of silicon. In the present review we mainly focus on the influence of isovalent doping on the properties of A-centers in silicon. Wherever possible, we make comparisons with related materials such as silicon germanium alloys and germanium. Recent advanced density functional theory studies that provide further insights on the charge state of the A-centers and the impact of isovalent doping are also discussed in detail.
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页码:2395 / 2410
页数:15
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