Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook

被引:0
作者
Claude Yugma
Jakey Blue
Stéphane Dauzère-Pérès
Ali Obeid
机构
[1] École Nationale Supérieure des Mines de Saint-Étienne,Department of Manufacturing Sciences and Logistics, Center of Microelectronics of Provence
来源
Journal of Scheduling | 2015年 / 18卷
关键词
Scheduling; Dispatching; Advanced Process Control (APC); Semiconductor manufacturing;
D O I
暂无
中图分类号
学科分类号
摘要
Scheduling in semiconductor manufacturing is of vital importance due to the impact on production performance indicators such as equipment utilization, cycle time, and delivery times. With the increasing complexity of semiconductor manufacturing, ever-new products and demanding customers, scheduling plans for efficient production control become crucial. Scheduling and control are mutually dependent as control requires information from scheduling, for example, where jobs are processed, and scheduling requires control information, for example, on which equipment operations can be processed. Based on a survey of the literature, this article proposes a review and an outlook for the potential improvements by binding scheduling decisions and information coming from advanced process control systems in semiconductor manufacturing.
引用
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页码:195 / 205
页数:10
相关论文
共 73 条
[1]  
Anderson M(2007)An evaluation of the benefits of integrating run-to-run control with scheduling and dispatching systems IEEE Transactions on Semiconductor Manufacturing 20 386-392
[2]  
Hanish CK(2012)Virtual metrology modeling for cvd film thickness International Journal of Control Science and Engineering 2 26-33
[3]  
Besnard J(2013)Tool condition diagnosis with a recipe-independent hierarchical monitoring scheme IEEE Transactions on Semiconductor Manufacturing 26 82-91
[4]  
Gleispach D(2005)Integrating preventive maintenance planning and production scheduling for a single machine IEEE Transactions on Reliability 54 304-309
[5]  
Gris H(2009)Recipe-independent indicator for tool health diagnosis and predictive maintenance IEEE Transactions on Semiconductor Manufacturing 22 522-535
[6]  
Ferreira A(2007)Real-time health prognosis and dynamic preventive maintenance policy for equipment under aging markovian deterioration International Journal of Production Research 45 3351-3379
[7]  
Roussy A(2012)Developing an automatic virtual metrology system IEEE Transactions on Automation Science and Engineering 9 181-188
[8]  
Kernaflen C(2007)Dual-phase virtual metrology scheme IEEE Transactions on Semiconductor Manufacturing 20 566-571
[9]  
Hayderer G(2012)An exact approach for scheduling jobs with regular step cost functions on a single machine Computers & Operations Research 39 1033-1043
[10]  
Blue J(2011)Scheduling jobs on parallel machines to minimize a regular step total cost function Journal of Scheduling 14 523-538