Identification of quantitative trait loci controlling resistance to maize chlorotic dwarf virus

被引：0
作者：
Mark W. Jones
Margaret G. Redinbaugh
Robert J. Anderson
R. Louie
机构：
[1] The Ohio State University,USDA, ARS Corn and Soybean Research, Ohio Agriculture Research and Development Center (OARDC)
[2] The Ohio State University,Department of Plant Pathology, Ohio Agriculture Research and Development Center (OARDC)
来源：
Theoretical and Applied Genetics | 2004年 / 110卷
关键词：
Quantitative Trait Locus; Simple Sequence Repeat Marker; Composite Interval Mapping; Major Quantitative Trait Locus; Wheat Streak Mosaic Virus;
D O I：
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中图分类号：
学科分类号：
摘要：
Ineffective screening methods and low levels of disease resistance have hampered genetic analysis of maize (Zea mays L.) resistance to disease caused by maize chlorotic dwarf virus (MCDV). Progeny from a cross between the highly resistant maize inbred line Oh1VI and the susceptible inbred line Va35 were evaluated for MCDV symptoms after multiple virus inoculations, using the viral vector Graminella nigrifrons. Symptom severity scores from three rating dates were used to calculate area under the disease progress curve (AUDPC) scores for vein banding, leaf twist and tear, and whorl chlorosis. AUDPC scores for the F2 population indicated that MCDV resistance was quantitatively inherited. Genotypic and phenotypic analyses of 314 F2 individuals were compared using composite interval mapping (CIM) and analysis of variance. CIM identified two major quantitative trait loci (QTL) on chromosomes 3 and 10 and two minor QTL on chromosomes 4 and 6. Resistance was additive, with alleles from Oh1VI at the loci on chromosomes 3 and 10 contributing equally to resistance.
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页码：48 / 57
页数：9
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