A small-angle x-ray scattering study of the nanostructural features of high-ash carbon materials

被引：0
作者：
Yu. V. Larichev
A. P. Koskin
P. M. Eletskii
S. A. Poluyanov
F. V. Tuzikov
A. V. Ishchenko
D. A. Zyuzin
机构：
[1] Russian Academy of Sciences,Boreskov Institute of Catalysis, Siberian Branch
[2] Novosibirsk State University,undefined
来源：
Journal of Structural Chemistry | 2014年 / 55卷
关键词：
carbon-silica composites; transmission electron microscopy; X-ray diffraction; small-angle X-ray scattering; masking liquid;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Nanostructured carbon-silica composite materials are prepared from different compounds in one-pot. They are characterized by BET, transmission electron microscopy, X-ray diffraction, and small-angle X-ray scattering. An effective method of the quantitative analysis of the structural dispersed characteristics of the template phase of silica in these composites is proposed.
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页码：750 / 756
页数：6
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