Resonance calculation for electrothermal damage to metal-insulator-metal structures

被引：0
|
作者：
V. M. Bogomol'nyi
机构：
来源：
Measurement Techniques | 2000年 / 43卷
关键词：
Acoustic Emission; Current Oscillation; Secondary Electron Emission; Current Filament; Electrical Ageing;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A thermal fluctuation theory has been developed for damage to metal-insulator-metal diode structures, which has been employed to determine the critical electrophysical parameters for oscillating structural changes arising in the insulator in a steady external electric field. The electronic processes giving rise to microdefects are of autowave origin and are accompanied by current oscillations, acoustic emission, and electromagnetic radiation. This can be used in remote-sensing nondestructive testing, and also for the elimination of manufacturing defects in solid-state electronic devices and the insulation in electrotechnical instruments.
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页码：538 / 543
页数：5
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