Crosstalk noise analysis of coupled on-chip interconnects using a multiresolution time domain (MRTD) technique

In this paper, crosstalk noise analysis of coupled on-chip interconnects is presented. The multiresolution time domain (MRTD) method is used to analyze the crosstalk noise model. The crosstalk-induced propagation time delay and crosstalk peak voltage on the victim line of interconnects are determined. The results obtained for the proposed MRTD model are compared with the conventional finite difference time domain (FDTD) method and validated with HSPICE simulations at the 22-nm technology node. The results show that crosstalk induced a propagation delay which is dynamic in-phase and dynamic out-of-phase, and peak voltage timing and the peak voltage value of functional crosstalk in the copper interconnects have an average error of less than 0.53% when compared with HSPICE simulations. The results for the proposed model are very similar to those of HSPICE simulations. Electromagnetic interference and electromagnetic compatibility of on-chip interconnects can also be addressed using the proposed method.