Studying structure of thin copper phthalocyanine films by reflectance anisotropy spectroscopy

被引:0
|
作者
V. L. Berkovits
A. B. Gordeeva
V. A. Kosobukin
E. I. Terukov
机构
[1] Russian Academy of Sciences,Ioffe Physical Technical Institute
来源
Technical Physics Letters | 2012年 / 38卷
关键词
GaAs; Technical Physic Letter; Film Plane; Substrate Plane; Copper Phthalocyanine;
D O I
暂无
中图分类号
学科分类号
摘要
The structure of thin molecular films of copper phthalocyanine (CuPc) on crystalline GaAs(001) and glass substrates has been studied by the method of reflectance anisotropy spectroscopy. It is shown that, using this method, it is possible to determine the orientational anisotropy in CuPc layers. It is established that the GaAs crystal surface produces orienting action on the molecular structure of CuPc films, while a glass substrate does not exhibit this effect. A model of the anisotropic reflection of light is considered that provides satisfactory description of the orientation-related features in the spectra of thin CuPc films as dependent on their thicknesses.
引用
收藏
页码:286 / 289
页数:3
相关论文
共 50 条
  • [1] Studying structure of thin copper phthalocyanine films by reflectance anisotropy spectroscopy
    Berkovits, V. L.
    Gordeeva, A. B.
    Kosobukin, V. A.
    Terukov, E. I.
    TECHNICAL PHYSICS LETTERS, 2012, 38 (03) : 286 - 289
  • [2] Studies on structure and Raman spectroscopy of Ni-doped copper phthalocyanine thin films
    Wang, XueYan
    Zheng, JianBang
    Qiao, Kai
    Qu, JunRong
    Cao, ChongDe
    APPLIED SURFACE SCIENCE, 2014, 297 : 188 - 194
  • [3] Polymorphism and structure formation in copper phthalocyanine thin films
    Reisz, Berthold
    Belova, Valentina
    Duva, Giuliano
    Zeiser, Clemens
    Hodas, Martin
    Hagara, Jakub
    Siffalovic, Peter
    Pithan, Linus
    Hosokai, Takuya
    Hinderhofer, Alexander
    Gerlach, Alexander
    Schreiber, Frank
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2021, 54 : 203 - 210
  • [4] Polymorphism and structure formation in copper phthalocyanine thin films
    Reisz, Berthold
    Belova, Valentina
    Duva, Giuliano
    Zeiser, Clemens
    Hodas, Martin
    Hagara, Jakub
    Siffalovi, Peter
    Pithan, Linus
    Hosokai, Takuya
    Hinderhofer, Alexander
    Gerlach, Alexander
    Schreiber, Frank
    Journal of Applied Crystallography, 2021, 54 : 203 - 210
  • [5] Reflectance anisotropy spectroscopy applied to organic thin films: The role of the substrate
    Sassella, A.
    Raimondo, L.
    Fazi, L.
    Trabattoni, S.
    Bonanni, B.
    Bussetti, G.
    Goletti, C.
    ORGANIC ELECTRONICS, 2018, 62 : 102 - 106
  • [6] Reflectance anisotropy spectroscopy as a tool for mechanical characterization of metallic thin films
    Wyss, A.
    Schamel, M.
    Sologubenko, A. S.
    Denk, R.
    Hohage, M.
    Zeppenfeld, P.
    Spolenak, R.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2015, 48 (41)
  • [7] Electrochromism of copper phthalocyanine thin films
    Bakkush, M
    Salleh, MM
    Yahaya, M
    AbuTalib, I
    SOLID STATE IONICS, 1996, 86-8 : 983 - 985
  • [8] Photoassisted scanning tunneling microscopy/spectroscopy of copper and lead phthalocyanine thin films
    Pochtenny, AE
    Stukalov, OM
    Mironov, VL
    Volgunov, DG
    Biryukov, AG
    PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2001, 3-4 : 109 - 115
  • [9] Structural characterization of copper-phthalocyanine thin solid films by FTIR spectroscopy
    Ding, Hanming
    Zhang, Yin
    Chen, Wenqi
    Xi, Shiquan
    Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis, 1997, 17 (02): : 73 - 76
  • [10] Vacuum deposited copper phthalocyanine thin films - structure and surface morphology
    Zhivkov, I
    Spassova, E
    Danev, G
    Andreev, S
    Ivanov, T
    VACUUM, 1998, 51 (02) : 189 - 192