Fractal Nature of Nanocomposite Thin Films with Co NPs in a-C:H Matrix

被引：0
作者：
Stefan Tǎlu
Slawomir Kulesza
Miroslaw Bramowicz
Ali Arman
Carlos Luna
Amine Achour
Azin Ahmadpourian
机构：
[1] Technical University of Cluj-Napoca,Young Researchers and Elite Club, Kermanshah Branch
[2] Faculty of Mechanical Engineering,Department of Physics, Kermanshah Branch
[3] Department of AET,undefined
[4] Discipline of Descriptive Geometry and Engineering Graphics,undefined
[5] University of Warmia and Mazury in Olsztyn,undefined
[6] Faculty of Mathematics and Computer Science,undefined
[7] University of Warmia and Mazury in Olsztyn,undefined
[8] Faculty of Technical Sciences,undefined
[9] Islamic Azad University,undefined
[10] Universidad Autónoma de Nuevo León (UANL),undefined
[11] Facultad de Ciencias Físico Matemáticas (FCFM),undefined
[12] Institut National de la Recherche Scientifique (INRS),undefined
[13] Islamic Azad University,undefined
来源：
Silicon | 2018年 / 10卷
关键词：
Nanocomposite thin films; AFM; Fractal analysis; Surface topography;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The aim of the present article is to investigate experimentally the fractal nature of the 3-D surface morphology of nanocomposite thin films consisting of partially oxidized cobalt nanoparticles with a face-centered-cubic (fcc) structure embedded in a hydrogenated amorphous carbon matrix. The samples were prepared by reactive magnetron sputtering using acetylene gas under gas pressures varying from 2.1 to 2.9 Pa. The characterization of the films surfaces was carried out by X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM), and the obtained AFM images were analyzed dividing them into motifs of significant peaks and pits using a segmentation algorithm. This analysis revealed that these nanocomposite thin films are well described as monofractal structures presenting only one scaling exponent whose value was found within the range from 2.4 to 2.7 for the different samples.
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页码：675 / 680
页数：5
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