Electrodynamic properties of lead Zirconate-Titanate thin films in the terahertz frequency range

被引:0
|
作者
G. A. Komandin
O. E. Porodinkov
L. D. Iskhakova
I. E. Spektor
A. A. Volkov
K. A. Vorotilov
D. S. Seregin
A. S. Sigov
机构
[1] Russian Academy of Sciences,Prokhorov General Physics Institute
[2] Russian Academy of Sciences,Fiber Optics Research Center
[3] Electronics and Automation,Moscow State Technical University of Radio Engineering
来源
Physics of the Solid State | 2014年 / 56卷
关键词
Dispersion Parameter; Lead Zirconate; Amorphous Film; Dynamic Conductivity; Titanate Thin Film;
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摘要
The transmission/reflection spectra of bilayer structures consisting of thin amorphous and polycrystalline Pb(Zr0.52Ti0.48)O3 ferroelectric films deposited on dielectric substrates of magnesium oxide MgO and sapphire α-Al2O3 were measured in the frequency range of 5–4000 cm−1. Based on these spectra and using the dispersion analysis method, the spectra of complex dielectric permittivity ɛ*(ν) and dynamic conductivity σ′(ν) of the films were simulated, the electrodynamic parameters of the films were determined, and the dielectric dispersion responsible for the formation of static permittivity was found.
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页码:2206 / 2212
页数:6
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