A set of test and measuring equipment in the field of electromagnetic compatibility

被引：1

作者：

Bobikov V.E.

Busygina L.A.

Domashenko G.D.

Lisitsyn V.P.

Nikiforov M.G.

Chumakov A.A.

机构：

来源：

Russian Electrical Engineering | 2011年 / 82卷 / 9期

关键词：

Electromagnetic compatibility; TEM and GTEM chambers; Test and measuring equipment;

D O I：

10.3103/S1068371211090045

中图分类号：

学科分类号：

摘要：

Instrumental support of scientific research and EMC tests are considered. Sample generators of field and conducted interferences of microsecond, nanosecond, and subnanosecond ranges are given. The structure of an optoelectronic electromagnetic field gage is described. Characteristics of TEM and GTEM chambers are given. © Allerton Press, Inc., 2011.

引用

页码：464 / 468

页数：4

共 3 条

[1]

Baldygin V.A., Beloshapko A.A., Davydov O.V., Et al., High-voltage generators of nanosecond and subnanosecond pulses, Appl. Phys, 4, pp. 11-14, (2001)

[2]

Bobikov V.E., Domashenko G.D., Nikiforov M.G., Instrumental support of electromagnetic compatibility research, Tekhnol. Elektromagn. Sovmestimosti, 2, pp. 57-62, (2004)

[3]

Lisitsyn . V P., Designing Generators and Emitters of Strong Electromagnetic Pulses, Materialy Vserossiiskoi Konferentsii "izluchenie i Rasseyanie EMV" (Proc. All. Russian Conf. "eMW Emission and Diffusion"), pp. 264-265, (2001)

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