Structural, Thermal and Luminescence Properties of AlN:Tm Thin Films Deposited on Silicon Substrate and Optical Fiber

被引：0

作者：

Amani Muhammad Maqbool

Dunja Alruwaili

Tahirzeb Milinovic

Ghafar Khan

Iftikhar Ali

机构：

[1] Department of Clinical and Diagnostic Sciences,

[2] the University of Alabama at Birmingham,undefined

[3] Department of Physics & Astronomy,undefined

[4] Ball State University,undefined

[5] Department of Physics,undefined

[6] Abdul Wali Khan University,undefined

[7] Physics Research Division,undefined

[8] PINSTECH,undefined

[9] Abbottabad University of Science and Technology,undefined

来源：

Semiconductors | 2018年 / 52卷

关键词：

thin films; structural analysis; X-ray diffraction; luminescence; aluminum nitride;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：2039 / 2045

页数：6

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