Structural, Optical, and Dielectric Properties of Azure B Thin Films and Impact of Thermal Annealing

Thin films of azure B (AB) have been prepared by thermal evaporation. Structural, optical, and dielectric characteristics of as-prepared and annealed samples were studied. AB is polycrystalline in as-synthesized powder form. Detailed x-ray diffraction studies showed amorphous structure for pristine and annealed films. Fourier-transform infrared vibrational spectroscopy indicated minor changes in molecular bonds of AB thin films either after deposition or after thermal annealing. Optical transmittance and reflection spectra of prepared thin films were studied at nearly normal light incidence in the spectral range from 200 nm to 2500 nm, showing marked changes without new peaks. Annealing increased the absorption coefficient and decreased the optical bandgap. Onset and optical energy gaps of pristine films were found to obey indirect allowed transition with values of 1.10 eV and 2.64 eV, respectively. Annealing decreased the onset and optical energy gaps to 1.0 eV and 2.57 eV, respectively. The dispersion parameters before and after annealing are discussed in terms of a single-oscillator model. The spectra of the dielectric constants (ε1, ε2) were found to depend on the annealing temperature in addition to the incident photon energy.