Application of polycapillary X-ray optics in residual stress measurement

被引：0
作者：
Fei Guo
Weilin Zhao
Xuepeng Wang
Xiaoyan Lin
Yude Li
机构：
[1] Beijing Normal University Beijing Radiation Center,Key Laboratory of Beam Technology and Material Modification of the Ministry of Education: College of Nuclear Science and Technology
来源：
Instruments and Experimental Techniques | 2015年 / 58卷
关键词：
Residual Stress; Counting Time; Diffraction Intensity; Irradiate Area; Residual Stress Measurement;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A polycapillary X-ray optics is developed and used in a micro-area XRD residual stress measurement. The results are compared with the traditional pinhole method. Both diffraction intensity and peak height obtained from the application of this polycapillary are enhanced by dozens of times than that from the pinhole method. The experimental results exhibit the advantage of this polycapillary optics in the micro-area residual stress measurement with higher detectable signal and more accuracy.
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页码：545 / 551
页数：6
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