Fractal Roughness Retrieval by Integrated Wavelet Transform

被引：0

作者：

Aristide Dogariu

Glenn Boreman

Jun Uozumi

Toshimitsu Asakura

机构：

[1] School of Optics/CREOL,Transylvania University

[2] University of Central Florida,University of Central Florida

[3] Research Institute for Electronic Science,undefined

[4] Hokkaido University,undefined

[5] Faculty of Engineering,undefined

[6] Hokkai-Gakuen University,undefined

[7] Physics Department,undefined

[8] Electrical Engineering Department,undefined

[9] Faculty of Engineering,undefined

[10] Hokkai-Gakuen University,undefined

来源：

Optical Review | 1999年 / 6卷

关键词：

Integrated wavelet transform; rough surface; fractal surface; self-similar surface; self-affine surface; autocorrelation; scaling exponent;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

An integrated-wavelet-transform (IWT) approach is proposed for the study of scattering from slightly rough surfaces that manifest scaling properties over a finite domain of correlation lengths. Instead of collecting angle-resolved intensities, values of the irradiance integrated over increasing areas are used to enhance the contributions of small irradiances at large scattering angles and to reduce the coherent noise. In the case of self-similar surfaces, the scaling behavior of IWT allows investigation of the surface roughness at various length scales. For the realistic case of self-affine surfaces, IWT permits the evaluation of the scaling exponent of the autocorrelation and also offers a direct way to evaluate the necessary length scale of the surface profile.

引用

页码：293 / 301

页数：8

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