Twist-angle dependence of moiré excitons in WS2/MoSe2 heterobilayers

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作者
Long Zhang
Zhe Zhang
Fengcheng Wu
Danqing Wang
Rahul Gogna
Shaocong Hou
Kenji Watanabe
Takashi Taniguchi
Krishnamurthy Kulkarni
Thomas Kuo
Stephen R. Forrest
Hui Deng
机构
[1] University of Michigan,Physics Department
[2] Fudan University,State Key Laboratory of Surface Physics, Department of Physics
[3] University of Maryland,Condensed Matter Theory Center and Joint Quantum Institute, Department of Physics
[4] University of Michigan,Applied Physics Program
[5] University of Michigan,Department of Electrical Engineering and Computer Science
[6] National Institute for Materials Science,Research Center for Functional Materials
[7] National Institute for Materials Science,International Center for Materials Nanoarchitectonics
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摘要
Moiré lattices formed in twisted van der Waals bilayers provide a unique, tunable platform to realize coupled electron or exciton lattices unavailable before. While twist angle between the bilayer has been shown to be a critical parameter in engineering the moiré potential and enabling novel phenomena in electronic moiré systems, a systematic experimental study as a function of twist angle is still missing. Here we show that not only are moiré excitons robust in bilayers of even large twist angles, but also properties of the moiré excitons are dependant on, and controllable by, the moiré reciprocal lattice period via twist-angle tuning. From the twist-angle dependence, we furthermore obtain the effective mass of the interlayer excitons and the electron inter-layer tunneling strength, which are difficult to measure experimentally otherwise. These findings pave the way for understanding and engineering rich moiré-lattice induced phenomena in angle-twisted semiconductor van der Waals heterostructures.
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