Two-dimensional positioning of the scanning tunneling microscope stage using a crystal as a scale reference

被引：0
|
作者：
H. Kawakatsu
Y. Hoshi
H. Bleuler
H. Kougami
M. Bossardt
N. Vezzin
机构：
[1] Instiute of Industrial Science,
[2] University of Tokyo,undefined
[3] Roppongi 7-22-1,undefined
[4] Minato-ku,undefined
[5] Tokyo 106,undefined
[6] Japan,undefined
来源：
Applied Physics A | 1998年 / 66卷
关键词：
Scanning Tunneling Microscope; Scanning Tunneling; Tunneling Microscope; Microscope Stage; Scale Reference;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：S853 / S855
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