Comparative Study on the Luminescence Properties of Violet Light-Emitting InGaN/GaN Multiple Quantum Wells with Different Barrier Thickness

被引:0
|
作者
Wei Liu
Feng Liang
Degang Zhao
Jing Yang
Desheng Jiang
Jianjun Zhu
Zongshun Liu
机构
[1] Northwestern Polytechnical University,School of Microelectronics
[2] Chinese Academy of Sciences,State Key Laboratory of Integrated Optoelectronics, Institute of Semiconductors
[3] University of Chinese Academy of Sciences,Center of Materials Science and Optoelectronics Engineering
来源
Journal of Electronic Materials | 2020年 / 49卷
关键词
InGaN quantum wells; GaN barrier thickness; photoluminescence; localization effect;
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中图分类号
学科分类号
摘要
The photoluminescence (PL) characteristics of two violet light-emitting InGaN/GaN multiple quantum well structures with different GaN barrier thickness, grown by metalorganic chemical vapor deposition, are investigated. It is found that for the sample with thick GaN barrier layers, the polarization effect in InGaN quantum wells is promoted. According to the temperature-dependent PL measurements, it is considered that the localization effect in a thick-barrier sample is enhanced which may be attributed to the increased growth time of GaN barrier layers. It is surprising to observe that at low temperatures, the PL spectral widths of the thick-barrier sample are smaller than those of the thin-barrier sample, although the distribution of In content in InGaN well layers may be more inhomogeneous for the thick-barrier sample.
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页码:3877 / 3882
页数:5
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