The use of lead isotopic abundances in trace uranium samples for nuclear forensics analysis

被引：0
|
作者：
A. J. Fahey
N. W. M. Ritchie
D. E. Newbury
J. A. Small
机构：
[1] National Institute of Standards and Technology,Surface and Microanalysis Science Division, Chemical Science and Technology Laboratory
来源：
Journal of Radioanalytical and Nuclear Chemistry | 2010年 / 284卷
关键词：
Uranium; Nuclear forensics; Uranium isotopes;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Secondary ion mass spectrometry (SIMS), secondary electron microscopy (SEM) and X-ray analysis have been applied to the measurement of U-bearing particles with the intent of gleaning information concerning their history and/or origin. The lead isotopic abundances are definitive indicators that U-bearing particles have come from an ore-body, even if they have undergone chemical processing. SEM images and X-ray analysis can add further information to the study that may allude to the extent of chemical processing. The presence of “common” lead that does not exhibit a radiogenic signature is clear evidence of anthropogenic origin.
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页码：575 / 581
页数：6
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