Spatial chemistry evolution during focused electron beam-induced deposition: origins and workarounds

被引:0
|
作者
Robert Winkler
Barbara Geier
Harald Plank
机构
[1] Graz Centre for Electron Microscopy,Institute for Electron Microscopy and Nanoanalysis
[2] Graz University of Technology,undefined
来源
Applied Physics A | 2014年 / 117卷
关键词
Regime Shift; Surface Electron; Increase Carbon Content; High Beam Current; Deposit Height;
D O I
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中图分类号
学科分类号
摘要
The successful application of functional nanostructures, fabricated via focused electron-beam-induced deposition (FEBID), is known to depend crucially on its chemistry as FEBID tends to strong incorporation of carbon. Hence, it is essential to understand the underlying mechanisms which finally determine the elemental composition after fabrication. In this study we focus on these processes from a fundamental point of view by means of (1) varying electron emission on the deposit surface; and (2) changing replenishment mechanism, both driven by the growing deposit itself. First, we revisit previous results concerning chemical variations in nanopillars (with a quasi-1D footprint) depending on the process parameters. In a second step we expand the investigations to deposits with a 3D footprint which are more relevant in the context of applications. Then, we demonstrate how technical setups and directional gas fluxes influence final chemistries. Finally, we put the findings in a bigger context with respect to functionalities which demonstrates the crucial importance of carefully set up fabrication processes to achieve controllable, predictable and reproducible chemistries for FEBID deposits as a key element for industrially oriented applications.
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页码:1675 / 1688
页数:13
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