Nanometer-Thick Textured ZnO Films: Preparation, Characterization and Interaction with Ethanol Vapor

被引:0
作者
D. Naumenko
V. Snitka
A. Ulcinas
I. Naumenko
K. Grigoras
机构
[1] Kaunas University of Technology,The Research Center for Microsystems and Nanotechnology
[2] VTT Technical Research Center of Finland,undefined
来源
Theoretical and Experimental Chemistry | 2013年 / 49卷
关键词
zinc oxide films; thin films; atomic layer deposition; piezoresponse force microscopy;
D O I
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中图分类号
学科分类号
摘要
A study was carried out on the effect of the reaction temperature in atomic layer deposition on the structural and piezoelectric properties of thin ZnO films (5–50 nm) by scanning electron microscopy, X-ray diffraction, piezoresponse force microscopy, and surface acoustic wave (SAW) spectroscopy. The piezoresponse was shown to be mainly a function of ZnO grain size and the monocrystalline structure perpendicular to the substrate plane. The results demonstrate promise for the use of textured ZnO films as sensitive coatings for acoustic gas sensors in instruments based on the SAW transducer amplification-frequency response.
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页码:96 / 102
页数:6
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