On Record Values and Reliability Properties of Marshall—Olkin Extended Exponential Distribution

被引：0
作者：
K. K. Jose
E. Krishna
Miroslav M. Ristic
机构：
[1] Central University of Rajasthan,Department of Statistics
[2] St. Joseph’s College for Women,Department of Statistics
[3] University of Nis,Faculty of Sciences and Mathematics
来源：
Journal of Statistical Theory and Applications | 2014年 / 13卷 / 3期
关键词：
Auto regressive processes; Entropy; Exponential distribution; Marshall—Olkin distribution; Record values; Reliability; Sample path; Simulation; Stress-strength analysis;
D O I：
10.2991/jsta.2014.13.3.6
中图分类号：
学科分类号：
摘要：
The Marshall–Olkin Extended Exponential distribution is introduced and reliability properties are studied. The p.d.f.’s of nth record value, joint p.d.f.’s, of mth and nth record values are derived to obtain the expression for mean, variance and covariance of reord values. The entropy of jth record value is derived.The stress strength analysis for the new model is carried out. We develop autoregressive processes and sample path properties are explored. The results are verified using simulations as well as graphical studies.The model is extended to higher orders also.
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页码：247 / 262
页数：15
相关论文
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