High-resolution computed tomography with scattered X-ray radiation and a single pixel detector

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作者
A. Ben-Yehuda
O. Sefi
Y. Klein
H. Schwartz
E. Cohen
R. H. Shukrun
S. Shwartz
机构
[1] Bar-Ilan University,Physics Department and Institute of Nanotechnology and Advanced Materials
[2] Bar-Ilan University,Faculty of Engineering and Institute of Nanotechnology and Advanced Materials
[3] Soreq Nuclear Research Center,Radiation Safety Department
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D O I
10.1038/s44172-024-00184-6
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摘要
X-ray imaging is a prevalent technique for non-invasively visualizing the interior of the human body and other opaque samples. In most commercial X-ray modalities, an image is formed by measuring the X-rays that pass through the object of interest. However, despite the potential of scattered radiation to provide additional information about the object, it is often disregarded due to its inherent tendency to cause blurring. Consequently, conventional imaging modalities do not measure or utilize these valuable data. In contrast, we propose and experimentally demonstrate a high resolution technique for X-ray computed tomography (CT) that measures scattered radiation by exploiting computational ghost imaging (CGI). We show that the resolution of our method can exceed 500 µm, which is approximately an order of magnitude higher than the typical resolution of X-ray imaging modalities based on scattered radiation. Our research reveals a promising technique for incorporating scattered radiation data in CT scans to improve image contrast and resolution while minimizing radiation exposure for patients. The findings of our study suggest that our technique could represent a significant advancement in the fields of medical and industrial imaging, with the potential to enhance the accuracy and safety of diagnostic imaging procedures.
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