Extended x-ray absorption fine structure study of incorporation of Bi and Pb atoms into the crystal structure of Ba4.5Nd9Ti18O54

被引:0
|
作者
M. Valant
I. Arčon
D. Suvorov
A. Kodre
T. Negas
R. Frahm
机构
[1] Jamova 39,“Jožef Stefan” Institute
[2] University of Ljubljana,undefined
[3] Trans-Tech Inc.,undefined
[4] Hamburger Synchrotronstrahlungslabor at Deutsches Elektronen Synchrotron DESY,undefined
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
In the extended x-ray absorption fine structure (EXAFS) study of the local environment of Bi3+ and Pb2+ ions incorporated in Ba4.5Nd9Ti18O54, actual sites of Bi- and Pb-incorporation are determined. Evidence is given that dopant ions are not distributed randomly on all theoretically possible sites; Bi3+ selectively enters one out of three possible channels, corresponding to the sites x = 0.9484, y = 0.2500, z = 0.2939, and/or x = 0.0455, y = 0.2500, z = 0.6928 previously occupied by Nd3+, while Pb2+ selectively enters site x = 0.4940, y = 0.2500, and z = 0.4993 previously shared by Ba2+ and Nd3+.
引用
收藏
页码:799 / 804
页数:5
相关论文
共 50 条
  • [1] Extended x-ray absorption fine structure study of incorporation of Bi and Pb atoms into the crystal structure of Ba4.5Nd9Ti18O54
    Valant, M
    Arcon, I
    Suvorov, D
    Kodre, A
    Negas, T
    Frahm, R
    JOURNAL OF MATERIALS RESEARCH, 1997, 12 (03) : 799 - 804
  • [2] Synchrotron X-ray Diffraction Study of Ba4.5Nd9Ti18O54 Microwave Dielectric Ceramics at 10–295 K
    C. C. Tang
    M. A. Roberts
    F. Azough
    C. Leach
    R. Freer
    Journal of Materials Research, 2002, 17 : 675 - 682
  • [3] Synchrotron x-ray diffraction study of Ba4.5Nd9Ti18O54 microwave dielectric ceramics at 10-295 K
    Tang, CC
    Roberts, MA
    Azough, F
    Leach, C
    Freer, R
    JOURNAL OF MATERIALS RESEARCH, 2002, 17 (03) : 675 - 682
  • [4] Role of Bi2O3 in optimizing the dielectric properties of Ba4.5Nd9Ti18O54 based microwave ceramics
    Valant, M
    Suvorov, D
    Kolar, D
    JOURNAL OF MATERIALS RESEARCH, 1996, 11 (04) : 928 - 931
  • [5] PbTiO3+Bi2Ti2O7掺杂的Ba4.5Nd9Ti18O54微波介质陶瓷
    吕文中
    F.Azough
    R.Freer
    材料研究学报, 2004, (02) : 144 - 148
  • [6] X-ray investigations and determination of the dielectric properties of the compound Ba4.5Gd9Ti18O54
    Valant, M
    Suvorov, D
    Kolar, D
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (1A): : 144 - 150
  • [7] IDENTIFICATION OF NEIGHBORING ATOMS IN EXTENDED X-RAY ABSORPTION FINE-STRUCTURE
    HALAKA, FG
    BOLAND, JJ
    BALDESCHWIELER, JD
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1984, 106 (19) : 5408 - 5413
  • [8] IDENTIFICATION OF NEIGHBORING ATOMS IN EXTENDED X-RAY ABSORPTION FINE STRUCTURE.
    Halaka, Folim G.
    Boland, John J.
    Baldeschwieler, John D.
    1600, (106):
  • [9] Extended x-ray absorption fine structure from hydrogen atoms in water
    Wilson, KR
    Tobin, JG
    Ankudinov, AL
    Rehr, JJ
    Saykally, RJ
    PHYSICAL REVIEW LETTERS, 2000, 85 (20) : 4289 - 4292
  • [10] STRUCTURE OF THE BI/INP(110) INTERFACE - A PHOTOEMISSION EXTENDED X-RAY ABSORPTION FINE-STRUCTURE STUDY
    CHOUDHARY, KM
    MANGAT, PS
    SESHADRI, P
    KILDAY, D
    MARGARITONDO, G
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (04): : 2294 - 2300