Effect of Residual Stresses on Electrophysical Properties of High-Ohmic Thick Films Based on SnO 2 ― Sb

被引：0

作者：

Igor M. Vinitskii

Artur G. Gonchar

David E. Dyshel'

Boris M. Rud'

机构：

[1] Institute for Problems of Materials Science,National Academy of Sciences of Ukraine

来源：

Powder Metallurgy and Metal Ceramics | 2002年 / 41卷

关键词：

mismatch; electrical properties; thick film; residual stresses;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

We have studied the effect of a mismatch between the thermal coefficients of linear expansion for the current-conducting phase and the glass on the electrical properties of composite thick films based on Sn0.93Sb0.07O2. The physical explanation of the results obtained is connected with the appearance of residual stresses in the film on cooling during heat treatment.

引用

页码：304 / 308

页数：4

共 10 条

[1]

Dyshel' D. E.(1984)Electrical conductivity of composite thick films based on doped tin dioxide powders Poroshk. Metall. 12 65-69

[2]

Rud' B. M.(1985)Effect of structure on the electrical conductivity of thick films based on doped tin dioxide Izv. Akad. Nauk SSR, Neorg. Mater. 21 1706-1709

[3]

Smolin M. D.(1963)High-pressure effects on oxide glasses. 1. Densification in rigid state J. Amer. Soc. 46 461-470

[4]

Dyshel' D. E.(1985)Tunneling effects in charge transfer between deep centers in semiconductors Fizika i Tekhnika Poluprovodnikov 19 460-undefined

[5]

Rud' B. M.(undefined)undefined undefined undefined undefined-undefined

[6]

Smirnov V. P.(undefined)undefined undefined undefined undefined-undefined

[7]

Smolin M. D.(undefined)undefined undefined undefined undefined-undefined

[8]

Mackenzie J. D.(undefined)undefined undefined undefined undefined-undefined

[9]

Masterov V. F.(undefined)undefined undefined undefined undefined-undefined

[10]

Kharchenko V. A.(undefined)undefined undefined undefined undefined-undefined

← 1 →