Temperature dependence of the coefficient of linear thermal expansion of single-crystal SmS

被引：0
|
作者：
V. V. Kaminskiĭ
S. M. Luguev
Z. M. Omarov
N. V. Sharenkova
A. V. Golubkov
L. N. Vasil’ev
S. M. Solov’ev
机构：
[1] Russian Academy of Sciences,Ioffe Physicotechnical Institute
[2] Russian Academy of Sciences,Institute of Physics, Dagestan Scientific Center
来源：
Semiconductors | 2007年 / 41卷
关键词：
65.40.De;
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摘要：
The coefficient of linear thermal expansion of single-crystal SmS has been measured in the temperature range 300–850 K by dilatometry and X-ray diffraction. It is shown that the difference in the results obtained by these two methods is due to the heating-induced formation of SmS phases with small lattice parameters (5.62–5.8 Å) close to that for the metallic SmS phase.
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页码：1 / 4
页数：3
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