Ion-beam formation and track modification of InAs nanoclusters in silicon and silica

被引:1
作者
Komarov F.F. [1 ,5 ]
Milchanin O.V. [1 ,5 ]
Skuratov V.A. [2 ]
Makhavikou M.A. [1 ,5 ]
Janse van Vuuren A. [3 ]
Neethling J.N. [3 ]
Wendler E. [4 ]
Vlasukova L.A. [5 ]
Parkhomenko I.N. [5 ]
Yuvchenko V.N. [1 ,5 ]
机构
[1] Sevchenko Institute of Applied Physical Problems, Belarusian State University, Minsk
[2] Joint Institute for Nuclear Research, Dubna
[3] Centre for High Resolution Transmission Electron Microscopy, Nelson Mandela Metropolitan University, Port Elizabeth
[4] Friedrich Schiller University Jena, Jena
[5] Belarusian State University, Minsk
关键词
III-V semiconductors - Silica - Irradiation - Indium arsenide - Silicon - Silicon oxides - Xenon - Ions - Ion beams;
D O I
10.3103/S106287381602012X
中图分类号
学科分类号
摘要
The implantation formation of InAs nanoclusters in silicon and silica and their modification via irradiation with Xe ions with an energy of 167 MeV and a fluence of 3 × 1014 cm–2 are studied. It is found that post-implantation annealing and irradiation with high-energy ions alter the size and shape of nanoclusters and cause structural transformations within them. The ordering of nanoclusters and their elongation along the trajectory of Xe ions in a SiO2 matrix is observed. © 2016, Allerton Press, Inc.
引用
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页码:141 / 145
页数:4
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