Effects of high temperature annealing on the device characteristics of Ga0.52In0.48P/GaAs and Al0.52In0.48P/GaAs heterojunction bipolar transistors

被引：2

作者：

Yow H.K. ^{[1
]}

Houston P.A. ^{[1
]}

Button C.C. ^{[1
]}

David J.P.R. ^{[1
]}

Ng C.M.S. ^{[1
]}

机构：

[1] Dept. of Electron. and Elec. Eng., University of Sheffield, Sheffield S1 3JD, Mappin Street

来源：

Journal of Electronic Materials | 1998年 / 27卷 / 1期

关键词：

AlInP/GaAs; Annealing; GaInP/GaAs; Heterojunction bipolar transistor (HBT);

D O I：

10.1007/s11664-998-0331-9

中图分类号：

学科分类号：

摘要：

GaInP/GaAs and AlInP/GaAs heterojunction bipolar transistor (HBT) structures were grown by low pressure metalorganic vapor phase epitaxy and annealed at various temperatures up to 675°C for 15 min. Subsequent comparisons with HBTs fabricated on both annealed and unannealed control samples showed no effects for annealing up to and including 575°C, but significant changes in the electrical characteristics were observed at an annealing temperature of 675°C. For the GaInP/GaAs devices, the base current increased by a significant amount, reducing the gain and increasing the base current ideality factor from 1.07 to 1.9. Photoluminescence and electrical measurements on the structure indicated that both the emitter and base were affected by an increase in the recombination times in those regions. These effects were attributed to an out-diffusion of hydrogen from the base during annealing. The emitter of the AlInP/GaAs HBT was affected less by the hydrogen diffusion because of the larger bandgap. These observations have important implications for device performance dependence on the details of the temperature/tame profile subsequent to the base growth.

引用

页码：17 / 23

页数：6

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