Shear Strength of Eutectic Sn-Bi Lead-Free Solders After Corrosion Testing and Thermal Aging

被引:0
作者
Milad Mostofizadeh
Juha Pippola
Laura Frisk
机构
[1] Tampere University of Technology,Department of Electrical Engineering
来源
Journal of Electronic Materials | 2014年 / 43卷
关键词
Shear strength; Sn-58Bi lead-free solder; corrosion; fracture mode;
D O I
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中图分类号
学科分类号
摘要
Low-cost manufacturing in the electronics industry is becoming more demanding, particularly in the production of consumer electronics. Such manufacturing processes require reliable and low-cost lead-free solders. Among the low temperature lead-free solders, eutectic Sn-Bi solder has attracted a great deal of interest since it offers good reliability comparable to that of Sn-Pb solders. In this paper, the shear strength of eutectic 42Sn-58Bi (wt.%) lead-free solder was studied using combinations of environmental tests including thermal aging at 100 °C, salt spray test, and a sequential combination of these tests. Microstructural studies on samples were performed at different time intervals of testing. To study the effect of salt spray and thermal aging on the mechanical reliability, shear testing was performed on the samples. Failure analysis including fractography on samples was conducted at different time intervals using a scanning electron microscope. Considerable corrosion was observed after the salt spray test. This was found to have a significant effect on the shear strength of the solder joints. Additionally, thermal aging was found to cause coarsening and to increase the thickness of intermetallic layers. This was also found to adversely affect the shear strength. The combination test was found to have the most significant effect, as the lowest shear strengths were seen after this testing.
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页码:1335 / 1346
页数:11
相关论文
共 48 条
  • [1] Mccormack M(1997)undefined J. Electron. Mater. 26 954-undefined
  • [2] Chen HS(2002)undefined IEEE Trans. Electron. Packag. Manuf. 25 257-undefined
  • [3] Kammlott GW(2001)undefined Scripta Mater. 44 1019-undefined
  • [4] Jin S(2002)undefined Corros. Sci. 44 887-undefined
  • [5] Suganuma K(2008)undefined Corros. Sci. 50 995-undefined
  • [6] Sakai T(2008)undefined Int. J. Fatigue 30 917-undefined
  • [7] Takagi Y(2011)undefined J. Electron. Mater. 40 2111-undefined
  • [8] Sugimoto J(1998)undefined Circuit World 25 25-undefined
  • [9] Ueshima M(2001)undefined J. Electron. Mater. 30 45-undefined
  • [10] Liu PL(2006)undefined Mater. Sci. Forum 510 546-undefined