Basics of X-ray Diffraction

被引：0

作者：

H. Stanjek

W. Häusler

机构：

[1] Rheinisch Westfälische Technische Hochschule,Institut für Mineralogie und Lagerstättenlehre

[2] Technische Universität München,Physik

来源：

Hyperfine Interactions | 2004年 / 154卷

关键词：

X-ray diffraction; Rietveld simulation; graphite; graphite clays; black pottery;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

X-ray diffraction (XRD) is the most comprehensive tool to identify minerals in complex mineral assemblages. The method is briefly described with special emphasis on clay and ceramics. As an example, an investigation of graphite-containing pottery sherds by XRD is presented. By comparing the measured XRD data with the patterns simulated by the Rietveld method, the graphite content of such samples could be determined.

引用

页码：107 / 119

页数：12

共 12 条

[1]

Rietveld H. M.(1969)A Profile Refinement Method for Nuclear and Magnetic Structures J. Appl. Cryst. { vn2} 65-71

[2]

Shimada I.(2001)Peruvian Black Pottery Production and Metalworking: A Middle Sicán Craft Workshop at Huaca Sialupe MRS Bulletin 26 25-30

[3]

Wagner U.(1987)Rietveld Refinement of Debye-Scherrer Synchroton X-ray Data from Al2O3 J. Appl. Cryst. 20 79-83

[4]

Thompson P.(2000)Quantifizierung silikatischer Tonminerale im Textur-und Pulverpräparat mit MacClayFit Berichte der Deutschen Ton und Tonmineralgruppe 7 256-265

[5]

Cox D. E.(1987)The Use of the Durbin-Watson d Statistic in Rietveld Analysis J. Appl. Cryst. 20 356-361

[6]

Hastings J. B.(1993)Structure-Refinement Program for Disordered Carbons J. Appl. Cryst. 26 827-836

[7]

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[8]

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[9]

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[10]

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