共 286 条
[1]
Zantye P B(2004)Chemical Mechanical Planarization for Microelectronics Applications Materials Science and Engineering: R: Reports 45 89-220
[2]
Kumar A(2010)Chemical Mechanical Polishing of a Ti-Si-N Nanocomposite and AFM Study on Its Nanostructure Journal of the Korean Physical Society 57 845-849
[3]
Sikder A K(2004)Investigation of Copper Removal Mechanisms during CMP Journal of the Electrochemical Society 151 G688-G692
[4]
Lee H(1999)A Comparative Study on the Roles of Velocity in the Material Removal Rate during Chemical Mechanical Polishing Journal of the Electrochemical Society 146 1952-1959
[5]
Kim D(2015)Signal Analysis of CMP Process based on AE Monitoring System Int. J. Precis. Eng. Manuf.-Green Tech. 2 15-19
[6]
Jeong H(2011)A Wafer-Scale Material Removal Rate Profile Model for Copper Chemical Mechanical Planarization International Journal of Machine Tools and Manufacture 51 395-403
[7]
Kim K(2000)Effects of Kinematic Variables on Nonuniformity in Chemical Mechanical Planarization International Journal of Machine Tools and Manufacture 40 1651-1669
[8]
Xu G(2015)Chemical Mechanical Planarization of Silicon Wafers at Natural pH for Green Manufacturing Int. J. Precis. Eng. Manuf. 16 2049-2054
[9]
Liang H(1997)The Early Days of CMP Solid State Technology 40 81-84
[10]
Zhao J(2015)Development of Green CMP by Slurry Reduction through Controlling Platen Coolant Temperature Int. J. Precis. Eng. Manuf.-Green Tech. 2 339-344