A floating-gate-type organic memory device was designed and fabricated by modifying a thin- film transistor structure. Thin films of plasma-polymerized methyl methacrylate (ppMMA) and plasmapolymerized styrene (ppS) were prepared for use as the functional thin film in an organic memory device. The ppMMA thin film was utilized as both an insulating and a tunneling layer. Two types of memory layers were utilized: (1) ppS and (2) vacuum evaporated Au. The fabricated devices were examined by using current-voltage measurements made using the double-sweep procedure. The memory window and the retention time of the memory devices were comparatively investigated. The device with the ppS memory layer revealed a memory window of 19 V and showed a retention time of over 2 h. We confirmed that ppS could be utilized as a memory layer for a floating-gate-type organic memory device.
机构:
Hanyang Univ, Dept Phys, Seoul 04763, South Korea
Hanyang Univ, Res Inst Nat Sci, Seoul 04763, South Korea
SK Hynix, NAND Dev Div, Inchon 17336, South KoreaHanyang Univ, Dept Phys, Seoul 04763, South Korea
Lee, Dong Uk
Qiu, Dongri
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机构:
Hanyang Univ, Dept Phys, Seoul 04763, South Korea
Hanyang Univ, Res Inst Nat Sci, Seoul 04763, South KoreaHanyang Univ, Dept Phys, Seoul 04763, South Korea
Qiu, Dongri
Kim, Eun Kyu
论文数: 0引用数: 0
h-index: 0
机构:
Hanyang Univ, Dept Phys, Seoul 04763, South Korea
Hanyang Univ, Res Inst Nat Sci, Seoul 04763, South KoreaHanyang Univ, Dept Phys, Seoul 04763, South Korea
Kim, Eun Kyu
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE,
2016,
213
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: 325
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