Fusion of 2-D SIMS Images Using the Wavelet Transform

被引：0
|
作者：
Thomas C. Stubbings
Stavri G. Nikolov
Herbert Hutter
机构：
[1]  Institute for Analytical Chemistry,
[2] Vienna University of Technology,undefined
[3] Getreidemarkt 9/151,undefined
[4] Vienna 1060,undefined
[5] Austria,undefined
[6]  Department of Electrical and Electronic Engineering,undefined
[7] University of Bristol,undefined
[8] Merchant Venturers Building,undefined
[9] Woodland Road,undefined
[10] Bristol BS8 1UB,undefined
[11] UK,undefined
来源：
Microchimica Acta | 2000年 / 133卷
关键词：
Key words: SIMS; multispectral images; image fusion; wavelets; wavelet transform; wavelet transform fusion.;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
 Secondary ion mass spectroscopy (SIMS) is a powerful method for element distribution examination of conducting and semi-conducting surfaces at high spatial resolution and with a high sensitivity. Routine surface analysis produces about 8 to 15 images in a short time, each of which displays the intensity distribution of one mass, thus generating a multispectral SIMS image. Formation of occlusions, segregations, and the overall location of the elements relative to each other, are difficult to recognise when looking at n separate 2-D images.
引用
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页码：273 / 278
页数：5
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