Fusion of 2-D SIMS Images Using the Wavelet Transform

被引：0

作者：

Thomas C. Stubbings

Stavri G. Nikolov

Herbert Hutter

机构：

[1] Institute for Analytical Chemistry,

[2] Vienna University of Technology,undefined

[3] Getreidemarkt 9/151,undefined

[4] Vienna 1060,undefined

[5] Austria,undefined

[6] Department of Electrical and Electronic Engineering,undefined

[7] University of Bristol,undefined

[8] Merchant Venturers Building,undefined

[9] Woodland Road,undefined

[10] Bristol BS8 1UB,undefined

[11] UK,undefined

来源：

Microchimica Acta | 2000年 / 133卷

关键词：

Key words: SIMS; multispectral images; image fusion; wavelets; wavelet transform; wavelet transform fusion.;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Secondary ion mass spectroscopy (SIMS) is a powerful method for element distribution examination of conducting and semi-conducting surfaces at high spatial resolution and with a high sensitivity. Routine surface analysis produces about 8 to 15 images in a short time, each of which displays the intensity distribution of one mass, thus generating a multispectral SIMS image. Formation of occlusions, segregations, and the overall location of the elements relative to each other, are difficult to recognise when looking at n separate 2-D images.

引用

页码：273 / 278

页数：5

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