Topological Data Analysis in Materials Science: The Case of High-Temperature Cuprate Superconductors

被引：0
|
作者：
I. Yu. Torshin
K. V. Rudakov
机构：
[1] Dorodnicyn Computing Centre,
[2] Federal Research Center “Informatics and Control,undefined
[3] ” Russian Academy of Sciences,undefined
来源：
Pattern Recognition and Image Analysis | 2020年 / 30卷
关键词：
algebraic approach to pattern recognition; theory of analysis of labeled graphs; data mining; superconductivity; materials science; solid state physics;
D O I：
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学科分类号：
摘要：
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页码：264 / 276
页数：12
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