Screening for urdbean leaf crinkle disease at field condition in blackgram [Vigna mungo (L.) Hepper]

被引：0
作者：
Palanivelu S. [1 ,2 ]
Narayana M. [2 ]
Palaniappan V. [3 ]
Natarajan G. [4 ]
Gandhi K. [5 ]
机构：
[1] National Pulses Research Center, Tamil Nadu Agricultural University, Vamban
[2] Centre for Plant Breeding and Genetics, Tamil Nadu Agricultural University, Coimbatore
[3] Department of Oilseeds, Tamil Nadu Agricultural University, Coimbatore
[4] Department of Agricultural Entomology, Tamil Nadu Agricultural University, Coimbatore
[5] Department of Plant Pathology, Tamil Nadu Agricultural University, Coimbatore
来源：
Vegetos | 2022年 / 35卷 / 1期
关键词：
Artificial screening; Blackgram; Resistance; ULCD;
D O I：
10.1007/s42535-021-00279-x
中图分类号：
学科分类号：
摘要：
Urdbean leaf crinkle disease (ULCD) is one of the most destructive diseases of blackgram. The causal agent is reported to be transmitted by whitefly, aphid, seed, and sap. Management strategies were developed to control the disease and vector. However, work on the development of resistant cultivars to ULCD is limited due to the non-availability of the resistant sources. Hence, in the present investigation, 27 genotypes were evaluated at the National Pulses Research Centre, Vamban during summer 2019 and repeated during late summer 2019 for their resistance against urdbean leaf crinkle virus disease. None of the genotypes recorded a highly resistant reaction. Among the 27 genotypes, CO 5 recorded resistance reaction in both the screening. Genotypes viz., APK 1 and Mash 1008 recorded moderate resistance in both the screening. Hence genotypes CO 5, APK 1, and Mash 1008 may be used as donors in the ULCD disease resistance breeding programme. © 2021, Society for Plant Research.
引用
收藏
页码：212 / 218
页数：6
相关论文
共 50 条
  • [31] Studies on Combining Ability for Seed Yield and Its Related Traits in Blackgram [Vigna mungo (L.) Hepper]
    Patial, Ranjana
    Mittal, R. K.
    Sood, V. K.
    Ahmed, Shahnawaz
    LEGUME RESEARCH, 2022, 45 (03) : 292 - 298
  • [32] Herbal pelleting on growth and yield in blackgram cv. VBN 3 [Vigna mungo (L.) hepper]
    Rarnarnoorthy, K.
    Sujatha, K.
    PLANT ARCHIVES, 2007, 7 (01): : 123 - 127
  • [33] Estimation of correlation and path analysis for yield and yield attributing traits in Blackgram [Vigna mungo (L.) Hepper]
    kumar, Lenin Y.
    Anuradha, C. H.
    Reddy, Sokka S.
    Srinivas, A. M. N.
    Subbaiah, Venkata K.
    RESEARCH JOURNAL OF BIOTECHNOLOGY, 2015, 10 (05): : 48 - 54
  • [34] Screening of Black Gram (Vigna Mungo L. Hepper) Varieties for Tolerance to Salinity
    Shanthi, P.
    Ramesh, P.
    Sakaravarthy, K. Sibi
    Vivekananthan, T.
    Umadevi, M.
    Sivasubramaniam, K.
    LEGUME RESEARCH, 2021, 44 (08) : 911 - 915
  • [35] GENETIC DIVERGENCE AND VARIABILITY STUDIES AMONG MICROMUTANTS IN BLACKGRAM [VIGNA MUNGO (L) HEPPER]
    Senapati, N.
    Misha, R. C.
    LEGUME RESEARCH, 2010, 33 (02) : 108 - 113
  • [36] Genetic Analysis of Seed Traits in Pre-breeding Lines of Blackgram [Vigna mungo (L.) Hepper]
    Devi, S. Manju
    Jayamani, P.
    Kumar, M.
    LEGUME RESEARCH, 2023, 46 (10) : 1314 - 1318
  • [37] SCREENING OF SOME CULTIVARS LINES OF BLACKGRAM (VIGNA-MUNGO (L) HEPPER) FOR RESISTANCE TO WATER-STRESS
    ASHRAF, M
    KARIM, F
    TROPICAL AGRICULTURE, 1991, 68 (01): : 57 - 62
  • [38] CHROMIUM INDUCED CYTOTOXICITY IN BLACKGRAM (VIGNA MUNGO L.)
    Chidambaram, A.
    Sundaramoorthy, P.
    Murugan, A.
    Ganesh, K. Sankar
    Baskaran, L.
    IRANIAN JOURNAL OF ENVIRONMENTAL HEALTH SCIENCE & ENGINEERING, 2009, 6 (01) : 17 - 22
  • [39] Combining Ability Analysis for Seed Yield and Component Traits over Season in Blackgram [Vigna mungo (L.) Hepper]
    Vadivel, K.
    Manivannan, N.
    Mahalingam, A.
    Satya, V. K.
    Vanniarajan, C.
    LEGUME RESEARCH, 2022, 45 (05) : 545 - 550
  • [40] Challenges in Pulses Productivity and Agronomic Opportunities for Enhancing Growth and Yield in Blackgram [Vigna mungo (L.) Hepper]: A Review
    Swaminathan, C.
    Surya, R.
    Subramanian, E.
    Arunachalam, P.
    LEGUME RESEARCH, 2023, 46 (01) : 1 - 9
12345