Method for estimating the morphological significance of simple forms of crystals from X-ray data

被引：0
作者：
E. B. Treĭvus
机构：
[1] St. Petersburg State University,
来源：
Crystallography Reports | 2010年 / 55卷
关键词：
Simple Form; Crystallography Report; Atomic Plane; Zircon Crystal; Structure Amplitude;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
When developing V.I. Mikheev and I.I. Shafranovskiĭ’s method for estimating the morphological significance of faces of different simple forms from X-ray reflection intensities, a way to approximately evaluate the morphological significance of simple forms on crystals from the structure amplitudes of the corresponding atomic planes is proposed. The potential for this approach is demonstrated by the examples of marcasite and zircon.
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页码：872 / 876
页数：4
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