Genetic analysis and mapping of adult plant resistance loci to leaf rust in durum wheat cultivar Bairds

被引：0
|
作者：
Caixia Lan
Bhoja R. Basnet
Ravi P. Singh
Julio Huerta-Espino
Sybil A. Herrera-Foessel
Yong Ren
Mandeep S. Randhawa
机构：
[1] International Maize and Wheat Improvement Center (CIMMYT),
[2] Campo Experimental Valle de México INIFAP,undefined
[3] Mianyang Institute of Agricultural Science/Mianyang Branch of National Wheat Improvement Center,undefined
来源：
Theoretical and Applied Genetics | 2017年 / 130卷
关键词：
Quantitative Trait Locus; Simple Sequence Repeat Marker; Durum Wheat; Leaf Rust; Recombinant Inbred Line Population;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：609 / 619
页数：10
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