Temperature dependence of exchange bias and coercivity in ferromagnetic/antiferromagnetic bilayers
被引:0
作者:
Jing-guo Hu
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机构:Nanjing University,National Laboratory of Solid State Microstructures
Jing-guo Hu
Guojun Jin
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机构:Nanjing University,National Laboratory of Solid State Microstructures
Guojun Jin
An Hu
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h-index: 0
机构:Nanjing University,National Laboratory of Solid State Microstructures
An Hu
Yu-qiang Ma
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机构:Nanjing University,National Laboratory of Solid State Microstructures
Yu-qiang Ma
机构:
[1] Nanjing University,National Laboratory of Solid State Microstructures
[2] Yangzhou University,College of Physics Science and Technology
来源:
The European Physical Journal B - Condensed Matter and Complex Systems
|
2004年
/
40卷
关键词:
Exchange Coupling;
Easy Axis;
Exchange Bias;
Uniaxial Anisotropy;
Magnetic Device;
D O I:
暂无
中图分类号:
学科分类号:
摘要:
A model for the temperature dependence of exchange bias and coercivity in epitaxial ferromagnetic (FM)/ antiferromagnetic (AFM) bilayers is developed. In this model, the interface coupling includes two contributions, the direct coupling and the spin-flop coupling. The temperature dependence arises from the thermal disturbance to the system, involved in the thermal fluctuations of magnetization of AFM grains and the temperature modulation of the relevant magnetic parameters. In addition, the randomness of original orientations of easy axes of AFM grains after field cooling is taken into account. A self-consistent calculation scheme is proposed and numerical treatment is carried out. The results show that the temperature dependence of exchange bias and coercivity is closely related to the sizes of AFM grains and the interface exchange coupling constants. Especially, the exchange bias will have a peak and the blocking temperature will increase if the spin-flop coupling plays a role. On the other hand, the original orientation distribution of easy axes of AFM grains will affect exchange bias and coercivity prominently. The prediction has been well supported by experiments.
机构:
Tohoku Univ, Grad Sch Engn, Dept Elect Engn, Sendai, Miyagi 9808579, JapanChungnam Natl Univ, ReCAMM, Taejon 305764, South Korea
Tsunoda, M.
Takahashi, M.
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机构:
Tohoku Univ, Grad Sch Engn, Dept Elect Engn, Sendai, Miyagi 9808579, Japan
Tohoku Univ, New Ind Creat Hatchery Ctr, Sendai, Miyagi 9808579, JapanChungnam Natl Univ, ReCAMM, Taejon 305764, South Korea