Contrast artifacts in tapping tip atomic force microscopy

被引：0
|
作者：
A. Kühle
A.H. Sorensen
J.B. Zandbergen
J. Bohr
机构：
[1] Department of Physics,
[2] bldg. 307,undefined
[3] The Technical University of Denmark,undefined
[4] DK-2800 Lyngby,undefined
[5] Denmark (Fax: (+45-45/93-27-66,undefined
[6] E-mail: anders.kyhle@fysik.dtu.dk),undefined
来源：
Applied Physics A | 1998年 / 66卷
关键词：
PACS: 61.16.Ch; 87.15; 87.64.Dz;
D O I：
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中图分类号：
学科分类号：
摘要：
引用
收藏
页码：S329 / S332
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