Genomic selection for spot blotch in bread wheat breeding panels, full-sibs and half-sibs and index-based selection for spot blotch, heading and plant height

被引：0
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作者：
Philomin Juliana
Xinyao He
Jesse Poland
Krishna K. Roy
Paritosh K. Malaker
Vinod K. Mishra
Ramesh Chand
Sandesh Shrestha
Uttam Kumar
Chandan Roy
Navin C. Gahtyari
Arun K. Joshi
Ravi P. Singh
Pawan K. Singh
机构：
[1] Borlaug Institute for South Asia (BISA),Biological and Environmental Science and Engineering Division
[2] International Maize and Wheat Improvement Center (CIMMYT),Institute of Agricultural Sciences
[3] King Abdullah University of Science and Technology (KAUST),Department of Plant Pathology, Wheat Genetics Resource Center
[4] Bangladesh Wheat and Maize Research Institute,Department of Plant Breeding and Genetics
[5] Banaras Hindu University,undefined
[6] Kansas State University,undefined
[7] Bihar Agricultural University,undefined
[8] ICAR–Vivekanand Parvatiya Krishi Anushandhan Sansthan,undefined
[9] CIMMYT-India,undefined
[10] NASC Complex,undefined
来源：
Theoretical and Applied Genetics | 2022年 / 135卷
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页码：1965 / 1983
页数：18
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