Precision Measurements of the Intensity in the Electron Diffraction Analysis

被引：0

作者：

A. K. Kuligin

A. S. Avilov

机构：

[1] Shubnikov Institute of Crystallography Federal Research Center “Crystallography and Photonics,

[2] ” Russian Academy of Sciences,undefined

来源：

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2020年 / 14卷

关键词：

electron diffraction; structure analysis; electron diffractometer; nano-objects;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：798 / 802

页数：4

共 26 条

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