Durability studies of metal evaporated tapes in a linear tape drive: Role of head contour and tape tension

被引:0
作者
Anton V. Goldade
B. Bhushan
机构
[1] The Ohio State University,Department of Mechanical Engineering, Nanotribology Laboratory for Information Storage and MEMS/NEMS
来源
Microsystem Technologies | 2005年 / 11卷
关键词
Metal evaporated tape; Wear; Durability; Head contour; Edge quality; Linear tape drive;
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学科分类号
摘要
Magnetic performance of metal evaporated (ME) tape makes it a prominent storage media candidate for future data recording systems. However, the durability of ME tapes, limited by a number of tribological issues, is a major concern. A preliminary investigation on durability of ME tapes in a linear tape drive has been carried out. The effect of head contour and tape tension on the durability of the head-tape interface has been studied. An optical microscopy based technique has been used to measure the quality of factory-slit tape edges and after use in a liner tape drive. Debris distribution over the head surface at the end of the testing has been monitored. The ME tapes are found to be sensitive to both head contour and tape tension. Some desirable attributes of ME tapes required to improve durability are discussed.
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页码:32 / 47
页数:15
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