Method of investigation of galvanomagnetic properties of CdxHg1 − xTe and CdxHg1 − xTe/Cd1 − yZnyTe

被引：0

作者：

V. A. Golubyatnikov

A. P. Lysenko

A. G. Belov

V. E. Kanevskii

机构：

[1] National Research University Higher School of Economics,

[2] АО State Research and Design Institute of Rare-Metal Industry (GIREDMET),undefined

来源：

Semiconductors | 2016年 / 50卷

关键词：

Hall effect; Hall coefficient; cadmium-mercury telluride; cadmium-zinc telluride;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The galvanomagnetic Van der Pau measurements are carried out on single-crystalline CdxHg1−xTe (MCT) bulk samples and CdxHg1 − xTe/Cd1 − yZnyTe (MCT/CZT) (x ≈ 0.2) epitaxial heterostructures at the temperature of 295 and 77 K. The sample rotates together with the cryostat in the electromagnet field through the angle from 0° to 360° with the step of 6°. It is shown that the angular dependences of the voltage under measurement are sinusoidal for the p-MCT bulk sample at the temperatures of 77 K; i.e., the Hall coefficient is independent of the magnetic-field induction. However, the angular dependences of the measured signal appreciably differ from sinusoids for the MCT/CZT epitaxial heterostructures at the temperature of 77 K.

引用

页码：1716 / 1719

页数：3

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